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Automatic test generation system for software
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Verification and testing of rapid single-flux-quantum (RSFQ) circuit for certifying logical correctness and performance
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Accurate and efficient testing of resistive bridging faults
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Structural delay testing of latch-based high-speed circuits with time borrowing
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Timing-oriented approach for delay testing
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Performance testing of data -path circuits
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Pseudo-Exhaustive Built-In Self-Test System For Logic Circuits
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A design system to support built-in self-test of VLSI circuits using BILBO-oriented test methodologies
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A variation aware resilient framework for post-silicon delay validation of high performance circuits
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Fault simulation and multiple scan chain design methodology for systems -on -chips (SOC)
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A low-cost framework for processor functional verification
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A knowledge based system for designing testable VLSI circuits
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